Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

Environmental Properties of ZnO Varistors with Variation of Sintering Temperature

소결온도에 따른 ZnO 바리스터의 내환경 특성

  • 이성갑 (국립 경상대학교 세라믹공학과) ;
  • 조현무 (서남대학교 전기전자공학부) ;
  • 이종덕 (서남대학교 전기전자공학부) ;
  • 박상만 (서남대학교 전기전자공학부)
  • Published : 2005.12.01
Download PDF
⟨ Previous Next ⟩

Abstract

ZnO varistor ceramics added a glass-frit 0.03 $wt\%$ were fabricated with variation of sintering temperature. The sintering temperature and time were $1125^{\circ}C\~1200^{\circ}C$ and 2 h. The average grain sizes increased and the varistor voltage decreased with increasing the sintering temperature. The values of the specimen sintered at $1200^{\circ}C$ were $23.7\;{\mu}m$ and 329 V, respectively. The leakage current of all specimens was less than $1\;{\mu}A$ at DC $82\%$ of varistor voltage. The clamping voltage ratio of the specimen sintered at $1175^{\circ}C$ was 1.37. The endurance of surge current and the deviation of varistor voltage of the specimen sintered at $1175^{\circ}C$ were 6400 $A/cm^2$ and ${\Delta}-2.81\%$, respectively. After the High Temperature Load Test(HTLT) at $85^{\circ}C$ for 1000 h, the specimen sintered at $1175^{\circ}C$ showed the lowest deviation of varistor voltage of ${\Delta}-1.92\%$.

Keywords

References

  1. T. K. Gupta, 'Application on zinc oxide varistors', J. Am. Ceram. Soc., Vol. 73, No. 7, p, 1817, 1990
  2. J. J. Lee, K. O'Brien, and M. S. Cooper, 'Second-breakdown characteristics of metaloxide varistors', J. Appl. Phys., Vol. 48, No. 3, p, 1252, 1977
  3. K. Mukae, K. Tsuda, and I. Nagasawa, 'Non-ohmic properties of ZnO-rare earth metal Oxide-$Co_{3}O_{4}$, ceramics', Jpn. J. Appl. Phys., Vol. 16, No.8, p, 1361, 1977
  4. K. Jinho, K. Toshio, and T. Yamaguchi, 'Effect of bismuth oxide content on the sintering of zinc oxide', J. Am. Ceram. Soc., Vol. 72, No.8, p. 1541, 1989
  5. K. Sato, Y. Takada, H. Maekawa, M. Otokake, and S. Tominaga, 'Electrical conduction of ZnO varistors under continuous dc stress', Jpn. J. Appl. Phys., Vol. 19, No. 5, p. 909, 1980
  6. H. H. Hng and K. M. Knowles, 'Micro-st ructure and current-voltage characteristics of multicomponent vanadium-doped zinc oxide varistors', J. Am. Ceram. Soc., Vol. 83, No. 10, p. 2455, 2000
  7. Y. P. Wang, W. I. Lee, and T. Y. Tseng, 'Degradation phenomena of multilayer ZnO-glass varistors studied by deep level transient spectroscopy', J. Appl. Phys. Lett., Vol. 69, No. 12, p. 1807, 1996
  8. C.-W. Nham, $ZnO-Pr_{6}O_{11}-CoO-Cr_{2}O_{3}-Er_{2}O_{3}$ based-ceramic varistors with high stability of nonlinear properties', J. Mater. Sci. Lett., Vol. 21, No.3, p. 201, 2002
  9. H. Q. Shao, X. H. Gao, and Z. C. Cao, 'Effect of annealing on phase structure and degradation of a zinc oxide varistor with Si-additive', J. Euro. Ceram. Soc., Vol. 17, p. 55, 1997 https://doi.org/10.1016/S0955-2219(96)00076-3
  10. 조현무, 이성갑, $Co_{3}O_{4}$ 첨가량 변화에 따른 ZnO Varistor의 전기적 특성', 전기전자재료학회논문지, 17권, 11호, p. 1186, 2004
  11. B. S. Chiou and F. W. Jih, 'Thermal and electrical stability of ZnO varistors with glass additives', J. E. M., Vol. 19, No. 12, p. 1339, 1980
  12. B. S. Shiou and F. W. Jih, 'Electrical properties and degradation phenomena of glass-doped ZnO varistors', Br. Ceram. Trans., Vol. 85, p. 118, 1986
  13. C. Leach, Z. Ling, and R. Freer, 'The effect of sintering temperature variations on the development of electrically active interfaces in zinc oxide vased varistors', J. E. Ceram. Soc., Vol. 20, p. 2759, 2000
  14. P. Duran, J. Tartaj, and C. Moure, 'Fully dense, fine grainde, doped zinc oxide varistors with improved nonlinear properties by thermal processing optimization', J. Am. Ceram. Soc., Vol. 86, No.8, p. 1326, 2003
  15. 電氣學會, '酸化亞鉛避電器の特性と試驗評價法', 電氣學會技術報告, 第474号, 1993
  16. IEC 60068, Part. No.2, 'Environmental Test', 1982
  17. IEC 61000-4-5 Standard 1.2/50 $\mu$s - 8/20 $\mu$s voltage-current combination pulse
  18. IEC 60060 High-voltage test techniques - Measuring systems
  19. IEC 1000-4-series, Electromagnetic Compatibility