Journal of Magnetics

  • 제10권4호
  • /
  • Pages.133-136
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  • 2005
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  • 1226-1750(pISSN)
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  • 2233-6656(eISSN)
한국자기학회 (The Korean Magnetics Society)
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Annealing Temperature Dependence of Exchange Bias Effect in Short Time Annealed NiFe/NiMn Bilayer Thin Film by FMR Measurement

  • Yoo, Yong-Goo (Electronics and Telecommunications Research Institute) ;
  • Park, Nam-Seok (Department of Electrical and Electronic engineering, Chungju National University) ;
  • Min, Seong-Gi (Department of Physics, Chungbuk National University) ;
  • Yu, Seong-Cho (Department of Physics, Chungbuk National University)
  • 발행 : 2005.12.01
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초록

The NiMn/NiFe bilayer structure which was short time annealed in order to induce unidirectional anisotropy were studied as a function of annealing temperature. The maximum exchange bias field of NiMn/NiFe bilayer was presented at $250^{\circ}C$ after short time annealing process with no external field. The appearance of exchange bias was due to phase transformation of NiMn layer. In plane angular dependence of a resonance field distribution which measured by FMR was analysed as a combined effect of unidirectional anisotropy and uniaxial anisotropy. The resonance field and the line width from FMR measurement were also analysed with annealing temperature.

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참고문헌

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피인용 문헌

  1. Ferromagnetic Resonance Study of Annealed NiFe/FeMn/CoFe Trilayers vol.45, pp.6, 2009, https://doi.org/10.1109/TMAG.2009.2020552
  2. Effect of Ni precursor solution concentration on the magnetic properties and exchange bias of Ni-NiO nanoparticulate systems vol.116, pp.9, 2014, https://doi.org/10.1063/1.4894629