대한전기학회논문지:시스템및제어부문D (The Transactions of the Korean Institute of Electrical Engineers D)

대한전기학회 (The Korean Institute of Electrical Engineers)
권호 표지

불완전 디버깅을 고려한 개발 소프트웨어의 최적 인도 시기 결정 방법에 관한 연구

A Study on the Optimum Release Time Determination of Developing Software Considering Imperfect Debugging

  • 발행 : 2005.06.01
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

The software reliability growth model(SRGM) has been developed in order to evaluate such measures as remaining fault number, fault rate, and reliability for the developing stage software. Most of the study literatures assumed that this detecting efficiency was perfect. However the actual fault detecting is generally imperfect, and widely known to many persons. It is not easy to develop and remove the fault existing in the software because the fault finding is difficult, and the exact solving method also not easy, and new fault may be introduced depending on the tester's capability. There, the fault removing efficiency influences the software reliability growth or developing cost of software. It is a very useful measure throughout the developing stage, much helpful for the developer to evaluate the debugging efficiency, and evaluate additional workload. Hence, the study for the imperfect debugging is important in point of software reliability and cost. This paper proposes that the fault debugging is imperfect and new fault may be introduced for the developing software during the developing stage.

키워드

참고문헌

  1. C. V. Ramamoorthy, F. B. Bastani, 'Software reliability - Status and perspectives', IEEE Trans. on Software Eng., vol. SE-8, pp354-371, 1982 August https://doi.org/10.1109/TSE.1982.235728
  2. Min Xie, Bo Yang, 'A study of the effect of imperfect debugging on software development cost', IEEE Trans. on Software Eng., vol.29, no.5, pp471-473, 2003.5 https://doi.org/10.1109/TSE.2003.1199075
  3. X. Zhang, X. Teng, 'considering fault removal efficiency in software reliability assessment', IEEE Trans. on Systems, man, and cybernetics, vol. 33, no.1, pp114-120, 2003.1 https://doi.org/10.1109/TSMCA.2003.812597
  4. A.L. Goel, K. Okumoto, 'A Markovian model for reliability and other performance measures of software systems', Proc. AFIPS Conf., pp770-774, 1979.6
  5. W. Kremer, 'Birth-death and bug counting', IEEE Trans. on Reliability, vol.R-32, no.1, pp37-47, 1983 https://doi.org/10.1109/TR.1983.5221472
  6. J. D. Musa, A. Iannino, K. Okumoto, 'Software Reliability : Measurement, Prediction, Application', pp230-238, 1987 March
  7. S. Yamada, H. Ohtera, H. Narihisa, 'Software reliability growth models with testing- efforts', IEEE Trans. on Reliability, vol. R-35, pp19-23, 1986 April
  8. Amrit L. Goel, Kazu Okumoto, 'Time-dependent error detection rate model for software reliability and other performance measure', IEEE Trans. on Reliability, vol. R-28, no.3, pp206-211, 1979.8 https://doi.org/10.1109/TR.1979.5220566
  9. S. Yamada, J. Hishitani, S. Osaki, 'Software-Reliability Growth with a Weibull Test-Effort : A Model & Application', IEEE Trans. on Reliability, vol.42, no.1, pp100-105, 1993.3 https://doi.org/10.1109/24.210278