한국초전도ㆍ저온공학회논문지 (Progress in Superconductivity and Cryogenics)
- 제7권2호
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- Pages.21-26
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- 2005
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- 1229-3008(pISSN)
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- 2287-6251(eISSN)
Breakdown Characteristics and Survival Probability of Turn-to- Turn Models for a HTS Transformer
- Cheon H.G. (Department of Electrical Engineering, Gyeongsang National University and Automation and Computer Research Centre of Engineering Research Institute) ;
- Baek S.M. (Fire Protection Engineering, Changwon College) ;
- Seong K.C. (Korea Electrotechnology Research Institute) ;
- Kim H.J. (Korea Electrotechnology Research Institute) ;
- Kim S.H. (Department of Electrical Engineering, Gyeongsang National University and Automation and Computer Research Centre of Engineering Research Institute)
- 발행 : 2005.05.01
초록
Breakdown characteristics and survival probability of turn-to-turn models were investigated under ac and impulse voltage at 77K. For experiments, two test electrode models were fabricated: One is point contact model and the other is surface contact model. Both are made of copper wrapped by O.025mm thick polyimide film(Kapton). The experimental results were analyzed statistically using Weibull distribution in order to examine the wrapping number effects on voltage-time characteristics under ac voltage as well as under impulse voltage in LN
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