한국레이저가공학회지 (Laser Solutions)
- 제7권2호
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- Pages.11-18
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- 2004
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- 1229-0963(pISSN)
OCT에 의한 다층 박막의 Spot Marking 분석
Investigation of Spot Marking in Multilayer Thin Films using OCT
-
신용진
(조선대학교 자연과학대학 물리학과) ;
- 김현진 (조선대학교 자연과학대학 물리학과) ;
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김영섭
(조선대학교 자연과학대학 물리학과) ;
- 박소희 (조선대학교 자연과학대학 물리학과)
-
Shin Yongjin
(Department of Physics, College of Natural Science, Chosun University) ;
- Kim Hyunjin (Department of Physics, College of Natural Science, Chosun University) ;
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Kim Youngseop
(Department of Physics, College of Natural Science, Chosun University) ;
- Park Sohee (Department of Physics, College of Natural Science, Chosun University)
- 발행 : 2004.08.01
초록
We propose a novel application of optical coherence tomography (OCT) to monitor pit formation in laser irradiated optical storage materials. A multilayer optical storage recordable compact disk, is composed of multiple layers, each of different structure. Disks were irradiated with aQ-Switched Nd:YAG laser with an energy of 373 mJ. Post-irradiated disks were evaluated by OCT and those images were compared with optical microscopy. Our results indicate that OCT is a useful instrument to investigate pit formation in multilayer optical storage disks and might also provide information to optimize optical memory technology.