Journal of the Korean Institute of Illuminating and Electrical Installation Engineers (조명전기설비학회논문지)

The Korean Institute of IIIuminating and Electrical Installation Engineers (한국조명전기설비학회)
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Development of Spectral Irradiance Measurement System

분광복사조도 측정 장치 개발

  • Published : 2004.09.01
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Abstract

Spectral irradiance measurement system was developed to measure the spectral irradiance of optical sources in the wavelength range from 250[nm] to 1600[nm]. Our system is composed of source system, fore-optics, monochromator system, optical detector system, and automatic control system. Optical detector system with PMT, Si, InGaAs, and IR enhanced InGaAs detectors is used to measure the wide spectrum of optical sources in ultraviolet visible, and infrared wavelength regions. Spectral irradiance of the 1[kW] quartz-halogen tungsten lamp was measured and compared in the wavelength range from 250[nm] to 1600[nm]. The differences between our results and those reported by NIST are below 3[%], 3.5[%], and 5[%] in the wavelength range of 450∼700[nm], 700∼1600[nm], 250∼400[nm], respectively.

광원의 분광복사조도를 250∼1600[nm] 파장 영역에서 정확하게 측정하기 위한 분광복사조도 측정 장치를 개발하였다. 분광복사조도 측정 장치는 광원 장치, 광학계, 분광장치, 광검출장치, 신호 처리 장치 등으로 이루어져 있다. 광검출 장치는 PMT, Si, InGaAs 및 IR enhanced InGaAs 광검출기를 이용함으로써 자외선, 가시광선, 적외선을 포함하는 넓은 파장 범위에서 광원의 스펙트럼을 측정할 수 있다. 개발된 측정 장치를 이용하여 1[kW] quartz-halogen 텅스텐 전구의 분광복사조도를 측정하여 비교하였는데, 측정 결과와 NIST에서 측정된 결과와는 차이는 450∼700[nm] 파장 영역에서 3[%] 이하이며, 700∼1600[m] 파장영역에서는 3.5[%] 이하이며, 250∼400[nm] 파장영역에서는 5[%] 이하로 측정되었다.

Keywords

References

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