반도체디스플레이기술학회지 (Journal of the Semiconductor & Display Technology)
- 제3권2호
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- Pages.23-26
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- 2004
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- 1738-2270(pISSN)
단축 인장에 의한 SU-8박막의 기계적 물성 측정
Measurement of mechanical properties of SU-8 thin film by tensile testing
초록
Thin film is one of the most general structures used in micro-electro-mechanical systems (MEMS). To measure the mechanical properties of SU-8 film, tensile testing was adopted which offers not only elastic modulus but also yield strength and plastic deformation by load-displacement curve. Tensile testing system was constructed with linear guided servo motor for actuation, load cell for force measurement and dual microscope for strain measurement.