반도체디스플레이기술학회지 (Journal of the Semiconductor & Display Technology)

한국반도체디스플레이기술학회 (The Korean Society Of Semiconductor & Display Technology)
권호 표지

메모리 소자의 DC parameter 검사회로 설계

The Circuit Design for the DC Parameter Inspection of Memory Devices

  • 김준식 (호서대학교 전기정보통신공학부) ;
  • 주효남 (호서대학교 전기정보통신공학부) ;
  • 전병준 (호서대학교대학원 전자공학과) ;
  • 이상신 (호서대학교대학원 전자공학과)
  • 발행 : 2004.03.01
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초록

In this paper, we have developed the DC parameters test system which inspects the properties of DC parameters for semiconductor products. The developed system is interfaced by IBM-PC. It is consisted of CPLD part, ADC(Analog-to-Digital Converter), DAC(Digital-to-Analog Converter), voltage/current source, variable resistor and measurement part. In the proposed system, we have designed the constant voltage source and the constant current source in a part. In the comparison of results, the results of the simulation are very similar to the ones of the implementation.

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