References
- Binnig, G., Quate, C.F. and Gerber, Ch., 'Atomic Force Microscope,' Physical Review Letters, Vol.56, No.9, pp.930-933, 1986 https://doi.org/10.1103/PhysRevLett.56.930
- Mate, C.M., McClelland, G.M., Erlandsson, R. and Chiang, S., 'Atomic-Scale Friction of a Tungsten Tip on a Graphite Surface,' Physical Review Letters, Vol.59, No.17, pp.1942-1945, 1987 https://doi.org/10.1103/PhysRevLett.59.1942
- Wienss, A., Persch-Schuy, G., Vogelgesang, M. and Hartmann, U., 'Scratching Resistance of Diamond-Like Carbon Coatings in the Subnanometer Regime,' Applied Physics Letters, Vol.75, No.8, pp.1077-1079, 1999 https://doi.org/10.1063/1.124602
- Lee, S.C, Chung, K.H., Kim, D.E., 'A Study on the Surface Damage between Head/Disk Interfaces by Using AFM,' Journal of Korean Society of Precision Engineering, Vol.15, No.9, pp.167-174, 1998
- Dagata, J. A., 'The Role of Space charge in Scanned Probe Oxidation,' Journal of Applied Physics, Vol.84, No.12, pp.6891-6900, 1998 https://doi.org/10.1063/1.368986
- Cheung, C.L., Hafner, J.H., Odom, T.W., Kim, K. and Lieber, C.M., 'Growth and Fabrication with Single-Walled Carbon nanotube Probe Microscopy Tips,' Applied Physics Letters, Vol.76, No.21, pp.3136-3138, 2000 https://doi.org/10.1063/1.126548
- Marrian, C.R.K., Perkins, F.K., Brandow, S.L., Koloski, T.S., Dobisz, E.A. and Calvert, J.M., 'Low Voltage Electron Beam Lithography in Self-Assembled Ultrathin Films with the Scanning Tunneling Microscope,' Applied Physics Letters, Vol.64, No.3, pp.390-392, 1994 https://doi.org/10.1063/1.111157
- Mamin, H.J. and Rugar, D., 'Thermomechanical Writing with an Atomic Force Microscope Tip,' Applied Physics Letter, Vol.61, No.8, pp.1003-1005, 1992 https://doi.org/10.1063/1.108460
- O'Shea, S.J., Atta, R. M. and Welland, M.E., 'Characterization of Tips for Conducting Atomic Force microscopy,' Review of Scientific Instrument, Vol.66, No.3, pp.2508-1512, 1995 https://doi.org/10.1063/1.1145649
- Chui, B. W., Microcantilevers for Atomic Force Microscope Data Storage, Kluwer Academic Publishers, 1999
- Terris, B.D., Rishton, S.A., Mamin, H.J., Ried, R.P. and Rugar, D., 'Atomic Force Microscope-based data storage: Track Servo and Wear Study,' Applied Physics A, Vol.66, pp.809-813, 1998 https://doi.org/10.1007/s003390051247
- Khurshudov, A.G., Kato, K. and Koide, H., 'Wear of the AFM Diamond Tip Sliding against Silicon,' Wear, Vol.203-204, pp.22-27, 1997 https://doi.org/10.1016/S0043-1648(96)07447-9
- Khurshudov, A. and Kato, K., 'Wear of the Atomic Force Microscope Tip under Light Load, Studied by Atomic Force Microscopy,' Ultramicroscopy Letter, Vol.60, pp.11-16, 1995 https://doi.org/10.1016/0304-3991(95)00071-8
- Bhushan, B., Handbook of Micro/Nano Tribology, CRC Press, 1999
- Bhushan, B., Principles and Applications of Tribology, John Wiley and Sons, Inc., 1999