The Transactions of the Korean Institute of Electrical Engineers P (전기학회논문지P)
- Volume 52 Issue 1
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- Pages.14-19
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- 2003
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- 1229-800X(pISSN)
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- 2586-7792(eISSN)
Effects of Heterostructure Electrodes on the Reliability of Ferroelectric PZT Thin Film
강유전체 PZT박막의 신뢰도에 미치는 헤테로구조 전극의 영향에 대한 연구
- Received : 2002.11.07
- Accepted : 2003.02.21
- Published : 2003.03.01
Abstract
The effect of the Pt electrode and the