Ferromagnetic resonance of Hensler $Ni_2$MnGa thin films

  • M. D. Huang (q-Psi and Department of Physics, Hanyang University) ;
  • Lee, N. N. (q-Psi and Department of Physics, Hanyang University) ;
  • Lee, Y. P. (q-Psi and Department of Physics, Hanyang University) ;
  • J. Y. Rhee (Department of Physics, Hoseo University) ;
  • J. Dubowik (Institute of Molecular Physics)
  • Published : 2003.10.01

Abstract

$Ni_2$MnGa films, deposited on mica and glass substrates, were studied by ferromagnetic resonance (FMR) technology. The temperature-dependent resonance field was measured and a martensitic phase transformation (MT) was found between 310 and 340 K, exhibiting an abnormality on the curve. The easy axis is found to be in the film plane. The line width increases as a whole with decreasing temperature, which is discussed in terms of the motional narrowing mechanism. The resonance field was also measured as a function of orientation and the results were fitted, exhibiting a good consistence.

Keywords

References

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