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Preparation of Low-Temperature Fired PZT Thick Films on Si by Screen Printing

  • Cheon, Chae-Il (Dept. of materials Sci, & Eng., Hoseo University) ;
  • Lee, Bong-Yeon (Dept. of materials Sci, & Eng., Hoseo University) ;
  • Kim, Jeong-Seog (Dept. of materials Sci, & Eng., Hoseo University) ;
  • Bang, Kyu-Seok (Electronic Components Research Center, Korea Electronics Technology Institute) ;
  • Kim, Jun-Chul (Electronic Components Research Center, Korea Electronics Technology Institute) ;
  • Lee, Hyeung-Gyu (Electronic Components Research Center, Korea Electronics Technology Institute)
  • Published : 2003.04.01

Abstract

Piezoelectric powder with the composition of PbTiO$_3$-PbZrO$_3$-Pb(Mn$\_$1/3/Nb$\_$2/3/)O$_3$ and small particle size of 0.3 $\mu\textrm{m}$ was investigated for low-temperature firing of PZT thick films. PbTiO$_3$-PbZrO$_3$-Pb(Mn$\_$1/3/Nb$\_$2/3)O$_3$ ceramics showed dense microstructure and superior piezoelectric properties, electromechanical coupling factor (k$\_$p/) of 0.501 and piezoelectric constant (d$\_$33/) of 224. The PZT paste was made of the powder and organic vehicles, and screen-printed on Pt(450nm)/YSZ(110nm)/SiO$_2$(300nm)/Si substrates and fired at 800∼900$^{\circ}C$. Any interface reaction between the PZT thick film and the bottom electrode was not observed in the PZT thick films. The PZT thick film fired at 800$^{\circ}C$ showed moderate electrical properties, the remanent polarization(p$\_$r/) of 16.0 ${\mu}$C/$\textrm{cm}^2$, the coercive field(E$\_$c/) of 36.7 ㎸/cm, and dielectric constant ($\varepsilon$$\_$r/) of 531. Low-temperature sinterable piezoelectric composition and high activity of fine particles reduced the sintering temperature of the thick film. This PZT thick film could be utilized for piezoelectric microactuators or microsensors that require Si micromachining technology.

Keywords

References

  1. M. Koch, N. Harris, R. Maas, A. G. R. Evans, N .M. White, and A. Brunnschweiler, 'A novel micropump design with thick film piezoelectric actuation,' Meas. Sci. Technol, Vol. 8, p. 49, 1997 https://doi.org/10.1088/0957-0233/8/1/008
  2. C. Lee, T. Itoh, R. Maeda, and T. Suga, 'Characterization of micromachined piezoelectric PZT force sensors for dynamic scanning force microscopy,' Rev. Sci. Instrum., Vol. 68, No. 5, P. 2091, 1997 https://doi.org/10.1063/1.1148102
  3. R. Maeda, Z. Wang, J. Chu, J. Akedo, M. Ichiki, and S. Yonekubo, 'Deposition and patterning technique for realization of Pb($Zi_0.52,Ti_0.480_3$) thick film micro actuator,' Jpn. J. Appl. Phys., Vol. 37, p. 7116, 1998 https://doi.org/10.1143/JJAP.37.7116
  4. J. Akedo and M. Lebedev, 'Piezoelectric properties and poling effect of Pb(Zr,Ti)$O_3$ thick films prepared for microactuators by aerosol deposition,' Appl. Phys. Lett., Vol. 77, No. 11, p. 1710, 2000 https://doi.org/10.1063/1.1309029
  5. C. Lucat, F. Menil and R. Von Der Muhll, 'Thick film densification for pyroelectric sensors,' Meas. Sci., Technol., Vol. 8, p. 38, 1997 https://doi.org/10.1088/0957-0233/8/1/006
  6. Y. Jeon, J. Chung, and K. No, 'Fabhcation of PZT thick films on silicon substrates for piezoelectric actuator,' J. Electroceramics, Vol. 4, No. 1, p.195, 2000 https://doi.org/10.1023/A:1009924113335
  7. V. Ferrari, D. Marioli, and A. Taroni, 'Thick film resonant piezo layers as new gravimethc sensors,' Meas. Sci. Technol, Vol. 8, p. 42, 1997 https://doi.org/10.1088/0957-0233/8/1/007
  8. T. Kubota, K. Tanaka, and Y. Sakabe, 'Formation of Pb(Zr,Ti)$O_3 Pb(Zn,Nb)O_3$ system piezoelectric thick films in low temperature firing process,' Jpn. J. Appl. Phys., Vol. 38, p. 5535, 1999 https://doi.org/10.1143/JJAP.38.5535
  9. T. Futakuchi, Y. Matui, and M. Adachi, 'Preparation of PbZr$O_3-PbTiO_3 Pb(Mg_\frac{1}{3}Nb\frac{2}{3})O_3$ thick films by screen printing,' Jpn. J. Appl. Phys., Vol. 38, No. 9B. p. 5528, 1999 https://doi.org/10.1143/JJAP.38.5528
  10. Y. Akiyama, K. Yamanaka, E. Fujisawa, and Y. Kowata, 'Development of lead zirconate titanate family thick films on various substrates,' Jpn. J. Appl. Phys., Vol. 38, No. 9B, p. 5524, 1999 https://doi.org/10.1143/JJAP.38.5524
  11. P. G. Jones, S. P. Beeby, P. Dargie, T. Papakostas, and N.M. White, 'An investigation into the effect of modified firing profiles on the piezoelectric properties of thick film PZT layers on silicon,'Meas. Sci. Technol, Vol. 11, p. 526, 2000 https://doi.org/10.1088/0957-0233/11/5/312

Cited by

  1. Effects of the Particle Size and the Firing Atmosphere on Electrical Properties in PNN-PZT Thick Films vol.63, pp.1, 2004, https://doi.org/10.1080/10584580490458649