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Single Nanoparticle Ion Trap (SNIT): A Novel Tool for Studying in-situ Dynamics of Single Nanoparticles

  • Published : 2003.05.20

Abstract

The development of high performance single nanoparticle ion trap (SNIT) apparatus for studying in-situ dynamics of single nanoparticles in controlled environments is described. The performance of SNIT apparatus has been evaluated for 500 nm SiO₂particles. The mass resolution of ~100 ppm and the capability of varying the charge states independently have been demonstrated.

Keywords

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