Analytical Science and Technology (분석과학)

The Korean Society of Analytical Sciences (한국분석과학회)
권호 표지

Synthesis and Structural Analysis of the Diaquabis(ethylenediamine)nickel(II) Bis(p-toluenesulfonate) Monohydrate

Diaquabis(ethylenediamine)nickel(II) Bis(p-toluenesulfonate) Monohydrate 층상 화합물의 합성과 구조 분석

  • Kim, Chong-Hyeak (Chemical Analysis Laboratory, Korea Research Institute of Chemical Technology) ;
  • Lee, Sueg-Geun (Chemical Analysis Laboratory, Korea Research Institute of Chemical Technology)
  • Received : 2002.04.19
  • Published : 2002.06.25
Download PDF
⟨ Previous Next ⟩

Abstract

The layer structure of the title compound, $[Ni(en)_2(H_2O)_2](CH_3C_6H_4SO_3)_2(H_2O)$ (en = ethylenediamine), consists of discrete cations, anions, and solvate water molecules linked by a hydrogen bonding network. The central Ni atom of the cation layer has a slightly distorted octahedral coordination geometry with the ethylenediamine ligands functioning as a N,N'-bidentate and the water ligands bonding through oxygen in a trans arrangement. The p-toluenesulfonate of the anion layer has an alternate sulfonate group directed toward opposite side of the cation layer. This layer structure is stabilized by a hydrogen bond involving the O atoms of the sulfonate, the water ligand, solvate water molecule, and the N atoms of the ethylenediamine.

Keywords

References

  1. S. L. Suib, Chem. Rev., 93, 803(1993).
  2. G. Alberti, 'Comprehensive Supramolecular Chemistry', Vol. 7, 151, J. L. Atwood, J. E. D. Davies, D. D. MacNicol, and F. Vogtle, Eds., Pergamon Press, New York, U.S.A.(1996).
  3. A. Clearfield, Chem. Rev., 88, 125(1988).
  4. B. J. Gunderman and P. J. Squattrito, Inorg. Chem., 34, 2399(1995).
  5. A. F. Benedetto, P. J. Squattrito, F. Adani, and E. Montoneri, Inorg. Chim. Acta, 260, 207(1997).
  6. C. H. Kim and S. G. Lee, Anal. Sci. & Tech 13, 534(2000).
  7. C. H. Kim and S. G. Lee, Acta Cryst. C57, 1259(2001).
  8. K. Nakamoto, 'Infrared and Raman Spectra of Inorganic and Coordination Compounds', Part B, John Wiley & Sons, New York, U.S.A.(1997).
  9. Siemens, XSCANS Data Collection Package, Siemens, Karlsruhe, Germany(1996).
  10. Siemens, SHELXTL Structure Analysis Package, Siemens, Karlsruhe, Germany(1998).
  11. G. M. Sheldrick, Acta Cryst., A46, 467(1990).