The Transactions of the Korean Institute of Electrical Engineers C (대한전기학회논문지:전기물성ㆍ응용부문C)

The Korean Institute of Electrical Engineers (대한전기학회)
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A Study on the Short-Term Deterioration Test Method of MgO in AC PDP

AC PDP 보호막 MgO의 단시간 열화시험방법에 관한 연구

  • Published : 2002.12.01
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Abstract

For ac PDP, the lifetime should be guaranted over, 30000 hours. The lifetime is correlated with the deterioration characteristics for the weakest element in ac PDP. However, the short-term deterioration test method of the at PDP has not well developed. In this paper, a short term deterioration test method of a given element in the ac PDP is proposed. By this method, MgO deterioration characteristics are investigated. The deterioration rate is decreased with MgO thickness but it was almost saturated over 5000$\AA$.

Keywords

References

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