나노기술을 이용한 Probe-based Data Storage(PDS)의 연구동항

References

1. IEEE Trans. Magnetics v.32 no.3 SPM based storage S.Hosaka
2. J.Vac.Sci.Technol. B v.15 no.4 Writing and reading bit arrays for information storage using conductance change of a Langmuir Blodgett film induced by scanning tunneling microscopy K.Takimoto(et al.)
3. Appl. Phys. Lett. v.73 no.6 Data storage with 0.7nm recording marks on a crystalline organic thin film by a scanning tunneling microscope L.P.Ma;W.J.Yang;Z.Q.Xue;S.J.Pang
4. Nature v.363 Nanometre scale recording and erasing with the scanning tunneling microscope A.Sato;Y.Tsukamoto
5. IBM J. Res. Develop. v.44 no.3 The Millipede More than one thousand tips for future AFM data storage P.Vettiger(et al.)
6. IEEE Trans.Nano technology v.1 no.1 The Millipede-Nanotechnology entering data storage P.Vettiger(et al.)
7. Microelectronic Eng. v.27 Demonstration of nanometer recording with a scanning probe microscope P Imura;S.Hosaka(et al.)
8. Jpn. J. Apple. Phys. v.32 no.3B Nanometer recording on graphite and Si substrate using an atomic force microscope in air S.Hosaka;H.Koyanagi;Kikukawa
9. Appl. Phys. Lett. v.66 no.22 Nanometer-scale recording on chalcogenide films with an atomic force microscope H.Kato;T.Tohda
10. J. Appl. Phys. v.89 no.2 Principle of ferroelectric domain imaging using atomic force microscope S.Hong(et al.)
11. J. Appl. Phys. v.70 no.5 Charge storage in a nitride-oxide-silicon medium by scannig capacitance microscopy R.C.Barrett;C.F.Quate
12. IEEE Trans.Electron Devices v.42 no.5 Data storage in NOS:Lifetime and carrier-to-noise measurements B.D.Terris;T.C.Barrett
13. J. Vac. Sci. Technol. B v.14 no.2 Charge injection and extraction on organic dot structure by atomic force microscopy H.Hieda;K.Tanaka;N.Gemma
14. Proc. IEEE v.87 no.6 High-density data storage based on the atomic force microscopy H.J.Mamin(et al.)
15. J. Appl. Phys. v.87 no.9 Single-chip computers with microelectromechanical systems-based magnetic memory L.R.Carley(et al.)
16. 제 3회 한국 MEMS 학술대회 초록집 초소형 대용량 저장장치를 위한 정전 프로브 어레이 개발 이창수;최재준;민동기;전동렬;전종업
17. Proc.15th Ann. Int. MEMS 2002 Conf. Compact copper/epoxy-based electromagnetic scanner for scanning probe applications H.Rothuizen(et al.)
18. Transducers '01, Fabrication of micro xy-stage with large area rectangular shuttle using anodic bonding process C.H.Kim;Y.K.Kim;H.M.Jeong;J.J.Choi;J.U.Jeon
19. J. Semiconductor Technol. and sci. v.1 no.1 Electromagnetic micro x-y stage for probe-based data storage J.J.Choi;H.Park;K.Y.Kim;J.U.Jeon