Journal of Korean Vacuum Science & Technology
- 제6권2호
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- Pages.84-87
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- 2002
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- 1226-6167(pISSN)
Grazing Incidence X-ray Diffraction (GIXRD) Studies of the Structure of Si$_{1-x}Ge_x$ /Si Surface Alloy
- Shi, Y. (Accelerator Lab, Department of Phyxics, Wuhan University) ;
- Zhao, R. (Accelerator Lab, Department of Phyxics, Wuhan University) ;
- Jiang, C.Z. (Accelerator Lab, Department of Phyxics, Wuhan University) ;
- Fan, X.J. (Accelerator Lab, Department of Phyxics, Wuhan University)
- 발행 : 2002.12.01
초록
The Si
키워드