참고문헌
- Jpn. J. Appl. Phys. v.40 Frequency agile microstrip patch antenna using piezoelectric substrates J. T. Song;I. H. Jo;Y. H. Kim https://doi.org/10.1143/JJAP.40.L515
- 전기전자재료학회논문지 v.7 no.2 졸-겔법으로 형성한 강유전체 PZT 박막의 고온 단시간 열처리 효과 및 전자 디바이스에의 응용 김광호
- 한국전기전자재료학회 2001 하계학술대회논문집 주파수 조정이 가능한 PZT air-gap antenna, 우형관;하용만;오승재;송준태
- 전기전자재료학논문지 v.12 no.7 PZT 강유전체 박막 캐패시터와 하부전극에 관한 연구 박영;정세민;문상일;정규원;김성훈;송준태;이준신
- Thin Solid Films v.375 no.1-2 A study of residual stress on rf reactively sputtered RuO₂ thin films Li Jian Meng;M. P. dos Santos https://doi.org/10.1016/S0040-6090(00)01174-3
- Thin Solid Films v.371 no.1-2 Formation of hillocks in Pt/Ti electrodes and their effects on short phenomena of PZT films deposited by reactive sputtering H. J. Nam;D. K. Choi;W. J. Lee https://doi.org/10.1016/S0040-6090(00)00970-6
- Materials Lett. v.38 Oxygen diffusion through RuO₂ bottom electrode of integrated ferroelectric capacitors J. H. Ahn;W. J. Lee;H. G. Kim https://doi.org/10.1016/S0167-577X(98)00167-0
-
Jpn. J. Appl. Phys.
v.36
$IrO_2/Pb(Zr_xTi_{1-x})O_3$ (PZT)/Pt ferroelectric thin film capacitors resistant to hydrogen annealing damage Keiko Kushida Abdelghafar;Hiroshi Miki;Fumiko Yano;Yoshihisa Fujisaki https://doi.org/10.1143/JJAP.36.L1032 -
Thin Solid Films
v.32
no.1
The effects of PbTiO
$_3$ thin template layer and Pt/RuO$_2$ hybrid electrode on the ferroelectric properties of sol-gel derived PZT thin film S. H. Kim;Y. S. Choi;C. E. Kim;D. Y. Yang - ISAF 92 Proceedings Leakage current mechanism and accelerated unified test of lead zirconate titante thin film capacitors In K. Yoo;Seshu B. Desu
-
J. Mater. Res.
v.12
no.6
Preparation of Pb(Zr
$_{0.52},Ti_{0.48})O_3$ thin films on Pt/RuO$_2$ double electrode by a new sol-gel route S. H. Kim;Y. S. Choi;C. E. Kim https://doi.org/10.1557/JMR.1997.0216 -
한국재료학회논문지
v.7
no.6
Sol-gel법에 의한 Pb(Zr,Ti)O
$_3$ 박막의 강유전체 특성 고가연;이은구;박진성;이종국;이우선;이재갑 - Microelectronic Engineering v.29 no.1 Characterisation of the fatigued state of ferroelectric PZT thin-film capacitors E. L. Colla;A. L. Kholkin;D. Taylor;A. K. tagantsev;K. G. Brooks;N. Setter https://doi.org/10.1016/0167-9317(95)00133-6
- Thin Film Ferroelectric Materials and Devices R. Ramesh