미세 구조물 진동과 마이크로/나노 기술

References

1. Ultra Micro Weight Determination in Controlled Environments Wolsky, S. P.(ed.);Zdanuk, E. J.(ed.)
2. Scanning Force Microscopy Sarid, D.
3. Scanning Probe Microscopy and Spectroscopy Weisendanger, R.
4. User's Guide to Autoprobe M5 Park Scientific Instruments
5. J. Appl. Phys. v.74 Surface and Domain Structures of Ferroelectric Crystals Studied with Scanning Force Microscopy Luthi, R.;Haefke, H.;Meyer, K. P.;Meyer, E.;Howald, L.;Guntherodt, H. -J. https://doi.org/10.1063/1.354969
6. Jpn. J. Appl. Phy. v.38 Detection Mechanism of Spontaneous Polarization in Ferroelectric Thin Films Using Electrostatic Force Microscopy Lee, K.;Shin, H.;Moon, W.;Jeon, J.;Park, Y. https://doi.org/10.1143/JJAP.38.L264
7. IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control v.47 no.4 An Application of Polarized Domains in Ferroelectric Thin Films Using Scanning Probe Microscopy Shin, H.;Lee, K.;Moon, W.(et al.) https://doi.org/10.1109/58.852061