Abstract
Density profiles of staple yarns were characterized and compressed by multi-resolution analysis based on wavelet transform. Wavelet analyses were performed to obtain the time-frequency characteristics through multi-resolution analysis. The original signals were decomposed into different frequency scale so as to detect the variation of the signals. The resulting wavelet coefficients at each scale were analyzed and characterized by multi-resolution plot analysis. The data compression based on the wavelet threshold method was performed to store the massive amount of yarn density data. The fabric image simulation results showed that the simulated image at the 95% compression level still has important characteristics such as defects or patterns.