An Application of Variance Reduction Technique for Stochastic Network Reliability Evaluation

확률적 네트워크의 신뢰도 평가를 위한 분산 감소기법의 응용

  • 하경재 (경남대학교 정보통신공학부) ;
  • 김원경 (경남대학교 벤처창업학부)
  • Published : 2001.06.01

Abstract

The reliability evaluation of the large scale network becomes very complicate according to the growing size of network. Moreover if the reliability is not constant but follows probability distribution function, it is almost impossible to compute them in theory. This paper studies the network evaluation methods in order to overcome such difficulties. For this an efficient path set algorithm which seeks the path set connecting the start and terminal nodes efficiently is developed. Also, various variance reduction techniques are applied to compute the system reliability to enhance the simulation performance. As a numerical example, a large scale network is given. The comparisons of the path set algorithm and the variance reduction techniques are discussed.

Keywords

References

  1. Networks v.20 Efficient Algorithms for Computing The Reliability of Permutation and Interval Graphs AboElFotoh, H. A.;Colbourn, C. J.
  2. Reliability Engineering Aggarawal, K. K.
  3. Discrete-Event System Simulation Banks, Jerry;Carson, John S. Ⅱ;Nelson, Bary L.
  4. A guide to Simulation Brateley, P.;Fox, B. L.;Schlage, L. E.
  5. Graph Theory with Applications to Engineering and Computer Science Deo, N.
  6. IEEE Transactions On Reliability v.40 no.5 Estimation of Network Reliability Using Graph Evolution Models Elperin, T.;Gertsbakh, I.;Lomonosov, M.
  7. Reliability Engineering Elsayed A. Elsayed
  8. IEEE Transactions on Reliability v.45 no.3 Computational Algebra Applications in Reliability Theory Hartless, G.;Leemis, L.
  9. Simulation Modeling & Analysis Law, Averill M.;Kelton, W. David
  10. IEEE Transactions on Reliability v.34 recent Developments in Computing of System Reliability Locks, Mitchell O.
  11. IEEE Transactions on Reliability v.R-27 An Efficient Methods for Reliability Evaluation of a General Networks Rai, S.;Aggarawal, K. K.
  12. IEEE Transactions on Reliability v.42 no.1 Experimental Results, On Processing of Path/Cut Terms in Sum of Disjoint Products Technique Soh, S.;Rai, S.