Journal of the Optical Society of Korea

Optical Society of Korea (한국광학회)
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Measurement of Absorption Coefficient for Quantum Confined Stark Effect In GaAsP/In P MQW Na Refractive Index Change

  • Song, Ju-Bin (Department of Electronic and Electrical Engineering, University College of London) ;
  • Killey, R. (Department of Electronic and Electrical Engineering, University College of London)
  • Received : 2001.06.21
  • Published : 2001.12.01
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Abstract

In this paper, we report measurement of absorption coefficient for various InGaAs MQW QCSE device structures. The absorption spectra over a range of QCSE were obtained from measured photocurrent spectra. The refractive index changes with applied electric field were calculated from the absorption spectra.

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References

  1. U. Koren, T.L. Koch, H. Presting, and B.I. Miller, Appl. Phys. Lett. 1, 368 (1987) https://doi.org/10.1063/1.98201
  2. T. H. Wood, J. Lightwave Technol. 6, 743 (1988) https://doi.org/10.1109/50.4063
  3. J. P. King, I. Hardcastle, H. J. Harvey, P. D. Greene, B. J. Shaw, M. G. Jones, D. J. Forbes, and M. C. Wright, Electron. Lett. 31, 1090 (1995) https://doi.org/10.1049/el:19950753
  4. J. B. Song, C. C. Button, and A .J. Seeds, Electron. Lett. 37, 426 (2001) https://doi.org/10.1049/el:20010302
  5. D. S. Chemla, T. C. Damen, D. A. B. Miller, A. C. Gossards, and W. Wiegmann, Appl. Phys. Lett 42, 864 (1983) https://doi.org/10.1063/1.93794
  6. A. J. Mosely, D. J. Robbins, A. C. Marshall, M. Q. Kearly, and J. I. Davies, Semicond. Sci. Technol. 4, 184 (1989) https://doi.org/10.1088/0268-1242/4/3/008
  7. M. Sugawara, T. Fuji, S. Yanazaki, and K. Nakajima, Phys. Rev. B. 42, 9587 (1990) https://doi.org/10.1103/PhysRevB.42.9587
  8. Y. Kutito, N. Yokouchi, T. Miyamoto, F. Koyama, and K. Iga, Jpn. J. Appl. Phys. 34, 5626 (1995) https://doi.org/10.1143/JJAP.34.5626
  9. A. M. Fox, D. A. B. Miller, G. Livescu, J. E. Cunningham, and W. Y. Jan, J. Quantum Electron. 27, 2281 (1991) https://doi.org/10.1109/3.97272
  10. F. Devaux, F. Dorgeuille, A Ougazzaden, F. Huet, M. Carre, A. Carenco, M. Henry, Y. Sorel, J. F. Kerdiles, and E. Jeanney, IEEE Photon. Technol. Lett. 5, 1288 (1993) https://doi.org/10.1109/68.250046