참고문헌
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J. of the Kor. Inst. Electrical & Material Eng.
v.11
no.9
Estimation of the anisotropy magnitude in amorphous
$As_{40}Ge_{10}S_{35}Se_{15}$ thin films by an interference method J. Y. Chun;S. H. Park;H. Y. Lee;H. B. Chung - J. Korean Institute of Electrical & Material Eng. v.12 no.12 The measurement on diffraction efficiency in polarization holography using amorphous chalcogenide thin films C. H. Yeo;S. J. Jang;J. I. Park(et al.)
- J. of the Kor. Inst. Electrical & Material Eng. v.13 no.9 The properties of diffraction efficiency in polarization holography using the chalcogenide thin films by the electric efects S. J. Jang;C. H. Yeo;J. I. Park;H. B. Chung
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