On-line Bus Monitoring of a System Using Bondary-Scan

경계스캔 구조를 사용한 시스템의 온라인 버스 모니터링

  • 송동섭 (연세대 공대 전기전자공학과) ;
  • 배상민 (연세대 공대 전기전자공학과) ;
  • 강성호 (연세대 공대 전기전자공학과) ;
  • 박영호 (한국전자통신연구원)
  • Published : 2000.12.01

Abstract

When a system is composed of multi-boards, an efficient bus arbitration method for the data transfer bus must be provided for guaranteeing proper operations. In this paper, a new test methodology is developed which is used for testing on-line bus arbitration. In the new test methodology, events that are occurred during bus arbitration are defined, and expected signals during fault-free bus arbitration are compared with the signals captured during on-line bus arbitration using boundary-scan cells. For this, a new test architecture is proposed which is efficient for the maintenance and the repair of multi-board systems. In addition, the new methodology can be used with off-line interconnect test using boundary-scan.

Keywords

References

  1. H. Bleeker, P. Eijinden and F. Jong, Boundary-Scan Test: A Practical Approach, Kluwer Academic Publishers, pp1-5, 1993
  2. K. P. Parker, The Boundary-Scan Handbook, Kluwer Academic Publisher, pp1-8, 1992
  3. C. Maunder, The board users guide to testable logic circuits, Addison-Wesley Publishing Company, pp4-23, 1992
  4. I. Ghosh, N. K. Jha and S. Dey, 'A low overhead design for testability and test generation technique for core-based systems', Proc. of International Test Conference, pp50-59, 1997 https://doi.org/10.1109/TEST.1997.639593
  5. 김현진, 신종철, 임용태, 강성호, '다중 주사 경로 회로 기판을 위한 내장된 자체 테스트 기법의 연구', 대한 전기공학회 논문지, pp14-25, 1999
  6. C. Su, S. W. Jeng, and Y. T. Chen, 'Boundary Scan BIST Methodology for Reconfigurable Systems', Proc. of International Test Conference, pp774-783, 1998 https://doi.org/10.1109/TEST.1998.743260
  7. A. Hassan, J. Rajski, and V. K. Agarwal, 'Testing and Diagnosis of Interconnects using Boundary Scan Architecture', Proc. of International Test Conference, pp126-136, 1988 https://doi.org/10.1109/TEST.1988.207790
  8. C. Poirier, 'IEEE P1149.5 to 1149.1 data and protocol conversion', Proc. of International Test Conference, pp527-535, 1993 https://doi.org/10.1109/TEST.1993.470658
  9. L. Whetsel, 'A proposed method of accessing 1149.1 in a backplane environment', Proc. of International Test Conference, pp206-216, 1992
  10. J. A. Floyd, 'Real-time on-board bus testing', Proc. of International Test Conference, pp140-145, 1995 https://doi.org/10.1109/VTEST.1995.512629
  11. K.A. Parker, The boundary-scan handbook, Kluwer Academic Publisher, pp11-52, 1993