Abstract
IEEE 1149.1 boundary scan architecture is used as a standard in board-level system testing. The simplicity of this architecture is an advantage in system testing, but at the same time, it it makes a limitation of applications. Because of several problems such as 3-state net conflicts, or ambiguity issues, interconnect testing for multi-drop multi-board systems is more difficult than that of single board systems. A new approach using IEEE 1149.1 boundary scan architecture for multi-drop multi-board systems is developed in this paper. Adding boundary scan cells on backplane bus lines, each board has a complete scan-chain for interconnect test. This new scan-path insertion method on backplane bus using limited 1149.1 test bus less area overhead and mord efficient than previous approaches.
