Journal of the Korean Institute of Telematics and Electronics D (전자공학회논문지D)
- Volume 36D Issue 6
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- Pages.21-27
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- 1999
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- 1226-5845(pISSN)
Erasing Methods for Improved Endurance Characteristics in Single-Poly EEPROM
단층 다결정실리콘 EEPROM의 Endurance 특성 개선을 위한 소거방법
- Yu, Yeong-Cheol (Dept. of Electronic Eng., Inchon Univ.) ;
- Jang, Seong-Jun (Dept. of office Automation, Yejoo Institute of Technology) ;
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Yu, Jong-Geun
(Dept. of Electronic Eng., Inchon Univ.) ;
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Lee, Gwang-Yeop
(Dept. of Computer science, Seokyoung Univ.) ;
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Kim, Yeong-Seok
(School of Electrical & Electronic Engineering, Chungbuk National University) ;
- Park, Jong-Tae (Dept. of Electronic Eng., Inchon Univ.)
- 유영철 (仁川大學敎 電子工學科) ;
- 장성준 (麗州大學 事務自動學科) ;
-
유종근
(仁川大學敎 電子工學科) ;
-
이광엽
(西京大學敎 컴퓨터科學科) ;
-
김영석
(忠北大學敎 電氣電子工學部) ;
- 박종태 (仁川大學敎 電子工學科)
- Published : 1999.06.01
Abstract
In this work, single-poly EEPROM was designed and fabricated by using standard
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