Sn-3.5Ag/Cu의 계면반응 및 접합특성

The Interfacial Reaction and Joint Properties of Sn-3.5Ag/Cu

  • 정명준 (전남대학교 공과대학 금속공학과) ;
  • 이경구 (한려대학교 제철금속학과) ;
  • 이도재 (전남대학교 공과대학 금속공학과)
  • Jung, Myoung-Joon (Dept. of Metallurgical Engineering, Chonnam National University) ;
  • Lee, Kyung-Ku (Dept. of Iron & Metallurgical Engineering, Hanlyo University) ;
  • Lee, Doh-Jae (Dept. of Metallurgical Engineering, Chonnam National University)
  • 발행 : 1999.07.01

초록

Sn-3.5Ag, Sn-3.5Ag-lZn Eoa납과 Cu기판과의 계면반응 및 접합특성에 관하여 검토하였다. Eoa납과 Cu기판이 접합된 시편은 $100^{\circ}C$$160^{\circ}C$에서 60일간 열처리하였으며, 전단하중을 가하여 강도를 측정하였다. $150^{\circ}C$에서 열처리에 따른 계면반응층의 두게는 Sn-3.5Ag/Cu계면이 Sn-3.5A9-IZn/Cu계면보다 빠르게 성장하였으며, 반응생성물 성장은$ t_{1/2}$에 비례하여 체적 확산 경향을 나타냈다. 계면 반응생성물은 Sn-3.5Ag/Cu계면의 경우 $Cu_{6}Sn_{5}$상이 형성되었고, $Ag_3Sn$상은 반응층 내부 및 반응층과 땜납의 계면에 석출하였으며, Zn을 첨가한 경우에는 계면에 $Cu_{6}Sn_{5}$ 상과 함께 $Cu_{5}Zn_{8}$상이 형성되었다. 땜납/기판의 전단강도는 Sn-3.5Ag합금에 Zn을 1% 첨가하면 증가하였으며, 열처리를 한 경우에는 감소하였다.

The interfacial reaction and joint properties of Sn-3.5Ag/Cu and Sn-3.5Ag-1Zn/Cu joint were studied. Modified double lap shear solder joints of Sn-3.5Ag and Sn-3.5Ag- lZn solder were aged for 60days at $100^{\circ}C$ and $150^{\circ}C$ and then loaded to failure in shear. The Sn-3.5Ag/Cu had a fast growth rate of the reaction layer in comparison with the Sn-3.5Ag-lZn at the aging temperature of $150^{\circ}C$ Through the SEM/EDS analysis of solder joint, it was proved that intermatallic layer was $Cu_{6}Sn_5$ phase and aged specimens showed that intermatallic layer grew in proportion to $t_{1/2}$, and the precipitate of $Ag_3Sn$ occur to both inner layer and interface of layer and solder. In case of Zn-containing composite solder, $Cu_{6}Sn_{5}$ phase formed at the side of substrate and $Cu_{5}Zn_{8}$ phase formed at the other side in double layer. The shear strength of the Sn-3.5Ag/Cu joint improved by addition of IZn. The strength of the joint increases with strain rate and decreases with aging temperature

키워드

참고문헌

  1. Ind. Eng. Chem. v.10 W.A. Zisman
  2. J. of Mater Sci. v.27 H.S. Betrabet;J.K. Mckinlay;S.M. Mcgee
  3. J. Electron. Mater. v.23 M.E. Loomans;S. Vaynman;G. Ghosh;M.E. Fine
  4. IEEE Trans. Comp. v.13 M. Harada;R. Satoh
  5. JEM v.26 D.R. Flanders;E.G. Jacobs;R.F. Pinizzotto
  6. JEM v.23 M. Mccormack;S. Jin
  7. J. Electr. Mat. v.15 D. Grivas;D. Frear;L.K. Quan;J.W. Morris
  8. The Merck Index(Eleventh Edition) v.1597 S. Budavari
  9. J. of Electronic Materials v.23 M.E. Loomans;S. Vaynman;G. Ghosh;M.E. Fine
  10. JEM v.23 J. Glazer
  11. Metallurgy of Low Temperature Pb-free Solders for Electronic Assembly v.40 J. Glazer
  12. J. Met. v.45 M. Mccormark;S. JIN
  13. JEM v.23 P.T. Vianco;P.F. Hlava;A.C. Kilgo
  14. JEM v.16 D. Frear;D. Grivas;J.W. Morris
  15. M. S. Thesis v.40 A Study on Wettability, Interfacial Reaction and Mechanical Properties of between Sn-Zn system Solders and Cu substrate J.B. Shim
  16. Paper presented at TMS fall meeting G. Ghosh
  17. Metall Trans. v.23A Z. Mei;A. J. Sunwoo;J. W. Morris