The Korean Journal of Ceramics

The Korean Ceramic Society (한국세라믹학회)
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Measurement of the Pockels Coefficient of PZT Thin Films Using a Two-beam Polarization Interferometer with a Reflection Configuration

  • Spirin, Vasilii (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
  • Lee, Changho (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
  • No, Kwangsoo (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology)
  • Published : 1999.12.01
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Abstract

A two-beam polarization (TBP) interfermeter with a reflection configuration for measuring the linear electroptic coefficient is described and investigated experimentally and theoretically. It is shown that a TBP interferometer can be used for measuring the Pockels coefficient of thin film with a strong Fabry-Perot effect. The TBP interferometer technique is used to measure the effective differential linear electro-optic coefficient $re=r_{33}-(n_0/n_0)^3r_{13}$of lead zirconate titanate (PZT) thin film. The results are in agreement with known data.

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