Abstract
Degradation diagnosis of XLPE insulated URD cables was accomplished through out new method, which was to be analyzed by non-electrical experiments and synthesized by degradation points. To supplement this method, It was also carried out using several electrical analyses. Tan$\delta$ had commonly a different tendency by means oftemperature and frequency and also appeared higher at the outer part rather than innerpart of insulator. PD-q increased generally in proportion to the applied voltage andshowed regular patterns in relation to the thickness of insulator. Breakdown voltageswere measured and breakdown lifetimes were predicted appling for Weibull distribution function. As a result, breakdown lifetime in failure cables was shorter up to$\fraction one-third$ times than that in general cables. It was very available to estimate cable degradation using above method, but it needs further study on XLPE insulated URD cables in order to improve reliability.