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Study on the Preparation of Eu $Eu(TTA)_3(phen)$ Thin Films by Physical Vapor Deposition Method and Their Characterization

진공 증착법에 의한 $Eu(TTA)_3(phen)$ 박막의 제작 및 특성 연구

  • Published : 1998.03.31

Abstract

Thin films of $Eu(TTA)_3(phen)$, which was known to show red-light emitting properties, were deposited under various deposition condition. The thickness, surface morphology, and photoluminescence(PL) were measured with ${\alpha}$-step profiler, Atomic Force Microscopy(AFM), and PL measurement apparatus. It was found that the thickness of $Eu(TTA)_3(phen)$ film can be controlled precisely by adjusting the amounts of $Eu(TTA)_3(phen)$ in the boat. As the thickness of these films increases, the surface roughness also increases. A structure of $Al/Eu(TTA)_3(phen)(850{\AA})/TPD(600{\AA})/ITO$ was fabricated, Electroluminescence(EL) spectrum of which shows the peak at the wavelength of 618nm.

Keywords