Analytical Science and Technology (분석과학)
- Volume 11 Issue 4
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- Pages.1045-1056
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- 1998
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- 1225-0163(pISSN)
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- 2288-8985(eISSN)
Characterization of Semiconductor Using Neutron Activation Analysis-I (Its Principle and Wafer Bulk Analysis)
중성자 방사화분석법에의한 반도체 특성조사-I (원리 및 웨이퍼 벌크 분석)
- Kim, Nak Bae (Analysis Research Division, Korea Institute of Geology, Mining and Materials)
- 김낙배 (한국자원연구소, 분석연구부)
- Published : 1998.08.01
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