Journal of the Korean Society for Nondestructive Testing (비파괴검사학회지)
- Volume 18 Issue 3
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- Pages.181-190
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- 1998
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- 1225-7842(pISSN)
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- 2287-402X(eISSN)
High Resolution Computerized Tomography System Using the Microfocus X-Ray for Inspection of Small Specimens
소형 물체의 검사를 위한 고해상도 미세 초점 X선 단층 촬영 시스템
- Kim, Young-Joo (Korea Research Institute for Standards and Science) ;
- Koo, Ja-Yong (Korea Research Institute for Standards and Science) ;
- Lee, Seung-S. (Korea Research Institute for Standards and Science) ;
- Kim, Whan-W. (Chungnam National University)
- Published : 1998.06.30
Abstract
A computerized tomography system was developed using the X-ray source that has diameter of 5 micrometer. The system is used for the nondestructive testing of specimens with diameter below 20 mm. The convolution back projection algorithm was adopted for the reconstruction of cross sectional image, and the shape of the X-ray beam was let parallel beam or fan beam to compare each resultant image. Our CT system was constructed to operate based on the personal computer. The sectional images of the fabricated specimens were reconstructed and analyzed. The reconstructed images well coincided with real images taken with optical microscope and gave us enough reports on the defects in the ceramic specimen. The resolution of the system regarded as about
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