A Failure-Censored Accelerated Life Test Sampling Plan with Both Life Specification Limits

수명의 양쪽규격을 고려한 정수중단 ALT 샘플링검사 계획

In this paper, the design of ALT(Accelerated Life Test) requires a sampling plan based on failure-censored(Type II censored) ALT with lognormal life distribution. Specially the environmental effect of products has been emphasized, so we considered the upper life limit as well as lower life limit in the ALT sampling plan. The optimal plan with a high stress and a low stress is used as test plan, and the total sample size for test and lot acceptability constant which minimize an asymptotic variance of maximum likelihood estimator of assumed model parameters and satisfy the given producer's risk and customer's risk are drawn out. These values can be acquired by means of the computer program that we coded for resolving the difficulty and complexity of calculation.