참고문헌
- International Test Conference Techniques for Characterizing DRAMs with a 500MHz interface James A. Gasbarro;Mark A. Horowitz
- International Test Conference High-performance Production Test Contactor for Fine-Pitch Integrated Circuits James A. Brandes
- International Test Conference Characterization of Edge Placement Accuracy in High-Speed Digital Pin Electronics Will Creek
- IEEE Transaction on Semiconductor manufacturing v.3 no.4 AC Product Defect Level and Yield Loss Jacob Savir
- HEWLETTPACKARD JOURNAL v.40 How to Treat Transmission Line Effects when Testing High-Speed Devices With a High Performance Test System Rainer Plitschka
- Chip Scale Review High-performance Contactors for Fine-pitch BGAs James A. Brandes