전자공학회지 (The Magazine of the IEIE)

대한전자공학회 (The Institute of Electronics and Information Engineers)
권호 표지

고성능 VLSI의 테스트 용이화를 위한 설계 방법

  • 조장현 (삼성전자(주) System LSI 사업부 CPU사업팀) ;
  • 김헌철 (삼성전자(주) System LSI 사업부 CPU사업팀)
  • 발행 : 1998.11.01
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참고문헌

  1. Digital Systems Testing and Testable Design M. Abramovici;M. A. Breuer;A. D. Friedman
  2. Testing of Semiconductor Memories: Theory and Practice A.J. van de Goor
  3. Digital Hardware Testing: Transistor-Level Fault Modeling and Testing R. Rajsuman
  4. Sunrise TestGen Reference Manual Release 3.0
  5. FastScan and Flex Test Reference Manual Mentor Graphics
  6. Proc. IEEE International Test Conference Testability Features of the MC68060 Microprocessor A. L. Crouch;M. Pressly;J. Circello
  7. Proc. IEEE International Test Conference A Low Overhead Design for Testability and Test Generation Technique for Core-based Systems I. Ghosh;N. K. Jha;S. Dey
  8. IEEE Design & Test of Computers Introducing Core-based System Design R. K. Gupta;Y. Zorian
  9. Integrated System Design Magazine web page:http://www.isdmage.com/EEdesign/HardCoretables.html.
  10. IEEE Design and Test of Computers Magazine v.14 no.1 Alpha 21164 Testability Strategy D. Bhavsar;J. Edmondson
  11. Proceedings of European Design and Test Conference Design and Test of the PowerPC™ 603 Microprocessor E. K. Vida-Torku;C. H. Malley;S. Park;R. Reed
  12. Proc. IEEE International Test Conference Testability Features of the SuperSPARC™ Microprocessor R. Patel;K. Yarlagadda
  13. Proc. IEEE International Test Conference $Pentium^？？$ PRO Processor Design for Test and Debug A. Carbine;D. Feltham
  14. Proc. of (6th) Asian Test Symposium Testability Features of R10000 Microprocessor J. Mori;B. Mathew;D. Burns;Y. Mok
  15. Proc. IEEE International Test Conference Testability Features of AMD-K™ Microprocessor R. S. Fetherston;I. P. Shaik;S. C. Ma