Quantum Confimement Effect in $SiO_2$ Thin Films Embedded with Semiconductor Microcrystallites

  • Wu-Xuemei (Physics department of Suzhou University) ;
  • Chen-Jing (Physics Department of Suzhou University) ;
  • Ahuge-Lanjian (Physics Department of Suzhou University)
  • Published : 1998.07.01

Abstract

$SiO_2$ thin films embedded with Ge microcrystallites (Ge-$SiO_2$) were prepared by use of r.f. co-sputtering technique from a Ge, $SiO_2$ composite target. The size of Ge crystallites can been modulated by the experiment parameters. The optical absorption and non-linear optical properties of Ge-$SiO_2$ films were measured. The blue shift of the optical absorption edge, the saturated absorption and two-photon absorption under the condition of resonant absorption have been observed, and are discussed according to the quantum confinement effect.

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