Reaction process in electrochromism of tungsten oxide thin films

The electrochromic behaviors of de-magnetron sputtered tungsten oxide thin films were investigated during coloration and bleach cycles using in situ real-time spectroscopic ellipsometry. Effective medium approximation and least-squares regression analyses were employed to investigate the electrochromic process. The optical properties of the tungsten oxide film were analyzed using the oscillator model and the evolution of the process using a reaction-limited model. In these analyses, we found that two different reaction rates were associated with the process. We ascribe this behavior to the microstructure of this films.