References
- Appl. Optics v.32 A.O'Hara;J.R.Hannah;I.Underwood;D.G.Vass;R.J.Holwill
- J. Mater. Res. v.8 C.A.Pico;T.D.Bonifield
- J. Vac. Sci. Technol. v.B9 F.Ericson;N.Kritensen;J.Å.Schweitz;U.Smith
- Trans. Metall. Soc. AIME v.242 F.d'Heurle;L.Berenbaum;R.Rosenberg
- J. Electron. Mater. v.22 R.A.Schwarzer;D.Gerth
- Thin Solid Films v.208 D.Gerth;D.Katzer;M.Krohn
- J. Mater. Res. v.4 C.Y.Chang;R.W.Vook
- J. Electrochem. Soc. v.116 C.J.Santoro
- J. Appl. Phys. v.45 P.Chaudhari
- Thin Soild Films v.228 C.Y.Chang;R.W.Vook
- MRS Bulletin v.22 no.10 W.W.Lee;P.S.Ho.
- J. Appl. Phys. v.64 S.T.Chen;C.H.Yang;F.Faupel;P.S.Ho