Wavelet frame 변환을 이용한 냉연 시각검사 알고리듬

Visual inspection algorithm of cold rolled strips by wavelet frame transform

  • 이창수 (수원대학교 전기전자정보통신공학부) ;
  • 최종호 (서울대학교 전기공학부, 자동화시스템공동연구소)
  • 발행 : 1998.06.01

초록

This paper deals with the detection, feature extraction and classification of surface defects in cold rolled strips. Inspection systems are one of the most important fields in factory automation. Defects such as slipmark and dullmark can be effectively detected with a Gaussian matched filter because their shapes are similar to Gaussian. It is justified that the proposed WF(Wavelet Frame) method could be regarded as multiscale Gaussian matched filter which can be applied to the inspection of cold rolled strip. After a wavelet frame transform, the entropies and moments are computed for each subband which pass through both local low pass filter and nonlinear operator. With these features as input, a MLP(Multi Layer Perceptron) is used as a classifier. The proposed inspection method was applied to the real images with defects, and hence showed good performance. The role of each extracted feature is analyzed by KLT(Karhunen-Loeve Transform).

키워드

참고문헌

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