Delay test for combinational and sequential circuit on IEEE 1149.1

조합회로와 순서회로를 위한 경계면 스캔 구조에서의 지연시험

In this paper, we analyze the problems of conventional and previous mehtod on delay test method in IEEE 1149.1. To solve them, we propose two kinds of delay test architectures. One is called ARCH-C, is for combinatonal circuit, and the other is ARCH-S, for clocked sequential circuit. ARCH-C is able to detect delay defect of 0.5 $T_{tck}$ or 1 $T_{tck}$ size. And ARCH-C have a fixed and small amount of hardware overhead, on the contrary preious method has a hardware overhead on the dependent of CUT. This paper discusses weveral problems of Delay test on IEEE 1149.1 for clocked sequential circuit. We suggest the method called ARCH-S, is based on a clock counting technique to generate continuous clocked input of CUT. the simulation results ascertain the accurate operation and effectiveness of the proposed architectures.res.