Built-in self test for testing neighborhood pattern sensitive faults in content addressable memories

Content addressable memory의 이웃패턴감응고장 테스트를 위한 내장된 자체 테스트 기법

A new parallel test algorithm and a built-in self test (BIST) architecture are developed to test various types of functional faults efficiently in content addressable memories (CAMs). In test mode, the read oepratin is replaced by one parallel content addressable search operation and the writing operating is performed parallely with small peripheral circuit modificatins. The results whow that an efficient and practical testing with very low complexity and area overhead can be achieved.