분석과학 (Analytical Science and Technology)
- 제10권5호
- /
- Pages.1087-1104
- /
- 1997
- /
- 1225-0163(pISSN)
- /
- 2288-8985(eISSN)
TOF-SIMS를 이용한 표면분석
Surface Analysis by Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)
-
Lee, Yeonhee
(Advanced Analysis Center, Korea Institute of Science &Technology)
;
-
Han, Seunghee
(Advanced Analysis Center, Korea Institute of Science &Technology)
- 발행 : 1997.10.25