Analytical Science and Technology (분석과학)
- Volume 10 Issue 5
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- Pages.1087-1104
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- 1997
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- 1225-0163(pISSN)
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- 2288-8985(eISSN)
Surface Analysis by Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)
TOF-SIMS를 이용한 표면분석
-
Lee, Yeonhee
(Advanced Analysis Center, Korea Institute of Science &Technology)
;
-
Han, Seunghee
(Advanced Analysis Center, Korea Institute of Science &Technology)
- Published : 1997.10.25
Abstract
Keywords