An Algorithm for Determining Double Rectifying Inspection Plans

선별형 2회 샘플링 검사방식의 최적설계를 위한 알고리즘 개발

These days, customers have attached great importance to the function of product liability and quality assurance. In Korea, the single rectifying sampling inspection for attribute (KS A 3105) has been used. But this inspection plan given by tables (KS A 3105) has some defects. There are limitations in the range of applications and irrationality of approximate probability and the double rectifying sampling inspection is not mentioned. Moreover, ATI (average total inspection) does not reflect sampling costs and the loss of nonconforming item. Therefore, the objectives of this study is to develope new algorithms and computer program that provide the optimal sampling inspection plan based on minimum linear costs (single & double inspection plan). The result of this study revealed that the new algorithm is less than KS A 3105 in ATI and basically, double inspection plan is more economical. Also it comes over restrictions in KS A 3105. So, it is definite that the optimal solution can be obtained considering cost factors in manufacturing and sampling process, and costs can be saved in the long term.