Journal of the Korean institute of surface engineering (한국표면공학회지)
- Volume 29 Issue 6
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- Pages.760-765
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- 1996
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- 1225-8024(pISSN)
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- 2288-8403(eISSN)
LOW TEMPERATURE DEPOSITION OFSIOx FILMS BY PLASMA-ENHANCED CVD USING 100 kHz GENERATOR
- Kakinoki, Nobuyuki (Department of Materials Processing Engineering, Nagoya University) ;
- Suzuki, Takenobu (Department of Materials Processing Engineering, Nagoya University) ;
- Takai, Osamu (Department of Materials Processing Engineering, Nagoya University)
- Published : 1996.12.01
Abstract
Silicon oxide thin films are prepared by plasma-enhanced CVD (PECVD) using 100kHz and 13.56MHz generators. Source gases are two sorts of mixture, tetramethoxysilane (TMOS) and oxygen, and tetramethylsilane (TMS) and oxygen. We investigate the effect of frequency on film properties of deposited films including mechanical properties. 100kHz PECVD process can deposit silicon oxide films at
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