에너지공학 (Journal of Energy Engineering)
- 제5권2호
- /
- Pages.193-197
- /
- 1996
- /
- 1598-7981(pISSN)
- /
- 2713-7074(eISSN)
Oxidation Behavior of U-0.75 wt% Ti Chips in Air at 250-50$0^{\circ}C$
- Kang, Kweon-Ho (Korea Atomic Energy Research Institute (NEMAC)) ;
- Shin, Hyun-Kyoo (Ajou University) ;
- Kim, Chul (Ajou University) ;
- Park, Young-Moo (Ajou University)
- 발행 : 1996.09.01
초록
A study was conducted on the oxidation behavior of U-0.75 wt% Ti chips (Depleted Uranium, DU chips) using an XRD and a thermogravimetric analyzer in the temperature range from 250 to 500
키워드