Journal of Energy Engineering (에너지공학)
- Volume 5 Issue 2
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- Pages.193-197
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- 1996
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- 1598-7981(pISSN)
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- 2713-7074(eISSN)
Oxidation Behavior of U-0.75 wt% Ti Chips in Air at 250-50$0^{\circ}C$
- Kang, Kweon-Ho (Korea Atomic Energy Research Institute (NEMAC)) ;
- Shin, Hyun-Kyoo (Ajou University) ;
- Kim, Chul (Ajou University) ;
- Park, Young-Moo (Ajou University)
- Published : 1996.09.01
Abstract
A study was conducted on the oxidation behavior of U-0.75 wt% Ti chips (Depleted Uranium, DU chips) using an XRD and a thermogravimetric analyzer in the temperature range from 250 to 500
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