References
- IEEE Trans. Electron Devices v.39 S. K. Dey;J. J. Lee
- Jpn. J. Appl. Phys. v.32 N. Nagao;T. Takeuchi;K. Iijima
- IEEE Trans. Ultrasonics, Ferroelectrics and Frequency Control v.38 H. Adachi;K. Wasa
- Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics F. Wangand;G. H. Hearling
- Jpn. J. Appl. Phys. v.24 K. Tanaka;M. Yamaguchi;H. Seto;M. Murata;K. Wakino
- J. Appl. Phys. v.48 M. Ishida;J. Matsunami;T. Tanaka
- Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics D. A. Tossell;J. S. Obhi;N. M. Shorrocks
- Ceram. Trans. v.25 J. J. Lee;S. K. Dey
- J. Opt. Soc. Am. v.B8 J. W. Wu
- 새물리 v.34 우화제;차성도;신승호
- J. Am. Ceram. Soc. v.54 G. H. Haertling;C. E. Land
- Proceedings of the Eighth IEEE International Symposium on the Eighth IEEE International Symposium on Applications of Ferroelectrics A. R. Khan;I. K. Yoo;S. B. Desu
- 새물리 v.29 유윤식;김성철;강광용;이형철;장민수
- J. Am. Ceram. Soc. v.66 T. Yamamoto;H. Igarashi;K. Okajaki
- IEEE Trans. Electron Devices v.39 S. K. Dey;J. J. Lee
- J. Cryst. Growth. v.45 M. Ishida;S. Tsuji;K. Kimura
- Proceedings of the Eighth IEEE International Symposium to Applications Ferroelectrics K. D. Preston;G. H. Heartling
- Fundamentals of Surface and Thin Film Analysis L. C. Feldman;J. W. Mayer