대한전기학회논문지 (The Transactions of the Korean Institute of Electrical Engineers)
- 제45권3호
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- Pages.438-443
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- 1996
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- 0254-4172(pISSN)
플라즈마중합법에 의한 폴리스티렌의 분자구조 제에 및 레지스트 특성 조사
Resist characteristics and molecular structure control of polystyrene by plasma polymerization method
초록
The effect of plasma polymerization conditions on the structure of the plasma polymerized styrene were investigated by using Fourier Transform Infrared Ray(FT-IR), Differential Scanning Calorimetry (DSC), Gel Permeation Chromatography(GPC). Plasma polymerized thin film was prepared using an interelectrode inductively coupled gas-flow-type reactor. We show that polymerization parameters of thin film affect sensitivity and etching resistance of plasma polymerized styrene is 1.41~3.93, and deposition rate of that are 32~383[.angs./min] with discharge power. Swelling and etching resistance becomes more improved with increasing discharge power during plasma polymerization. (author). 11 refs., 10 figs., 1 tab.