Hetero-Epi막 성장용 사파이어 기판의 산에칭

Acid Etching of Sapphire Substrate for Hetero-Epitaxial Growth

  • 김향숙 (한국화학연구소 고체화학실) ;
  • 황진수 (한국화학연구소 고체화학실) ;
  • 정필조 (한국화학연구소 고체화학실)
  • Kim, Hyang Sook (Solid State Chemistry Lab., Korea Research Institute of Chemical Technology) ;
  • Hwang, Jin Soo (Solid State Chemistry Lab., Korea Research Institute of Chemical Technology) ;
  • Chong, Paul Joe (Solid State Chemistry Lab., Korea Research Institute of Chemical Technology)
  • 발행 : 19950100

초록

단결정 적층막을 제조하기 위해 사용되는 사파이어 기판에 대하여 황산과 인산의 혼합용액 화학적 에칭을 조사하였다. 여러가지 배향면의 사파이어에 대한 에칭정도는 황산과 인산의 3:1 조성과 $315{\pm}2^{\circ}C$에서 에칭시간에 의존하였다. 280~320$^{\circ}C$ 범위에서 30분간씩 산에칭시킨 후에 에칭속도(R)를 구하였고, log R에 대한 $1/T$ semilog plot로부터 활성화에너지$(E_a)$를 구하였으며, 그것은 $({\bar1}012) > (10{\bar1}0) > (11{\bar2}0) > (0001)$면 순서로 감소하였다. 한편 (0001), $({\bar1}012),\;(10{\bar1}0)$$(11{\bar2}0)$면의 표층 두께를 각각 64.6, 46.5, 16.2와 5.1 ${\mu}m$ 에칭시킨 후의 기판 표면을 SEM으로 관찰하였다.

The surface of a sapphire substrate used for hetero-epitaxy was chemically polished in a mixture of $H_3PO_4\;and\;H_2SO_4$ solution. The extent of etching for various crystal orientations was found to be dependent on the etching time at $315{\pm}2^{\circ}C$ and at the composition of $H_2SO_4 : H_3PO_4$=3 : 1. In addition, the etching rates of the substrates were investigated in the mixture of $H_2SO_4 : H_3PO_4$=3 : 1 by volume and in the temperature range of 280~320$^{\circ}C$. From the plot of log R against 1/T, the activation penergy ($(E_a)$) was found to be in the order of $({\bar1}012) > (10{\bar1}0) > (11{\bar2}0) > (0001)$ plane. After removing the surface layers of the sapphire with (0001), $({\bar1}012),\;(10{\bar1}0)\;and\;(11{\bar2}0)$ plane by a thickness of 64.6, 46.5, 16.2 and 5.1 ${\mu}m$, respectively, the morphology of the resulting surface was observed by SEM.

키워드

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